We imaged a specimen of aerosolized nanoparticles collected
on a Si wafer using a FEI Helios NanoLab 650 (Hillsboro, OR)
focused ion beam scanning electron microscope (FIB SEM).
Small FOVs of a specimen were acquired and stored as TIFF
images using the FEI’s MAPS correlative microscopy software.
The small FOVs have an overlap of 10% in horizontal and
vertical directions, and they form a grid of 40 x 59 raw
image tiles. Each FOV image is 6.1MB (3072 x 2048 pixels,
8 bits per pixel) resulting in a total dataset size of
14 GB. Each pixel corresponds to 48.5 nanometers in
horizontal and vertical dimensions.
We imaged debris from 3D printing process for two types of materials
using a FEI Helios NanoLab 660 (Hillsboro, OR) focused ion beam
scanning electron microscope (FIB SEM). A grid of field of views (FOVs)
was acquired for each specimen in a Tiff file format with a spatial overlap of 10%
in horizontal and vertical directions. Each FOV image is 6.1MB
(3072 x 2048 pixels, 8 bits per pixel). The grid dimensions are 18 x 18 and 25 x 20
FOVs resulting in a total dataset size of 5 GB. Each pixel corresponds
to approximately 65 nanometers in horizontal and vertical dimensions.
These data sets provide information about spatial distribution and
types of released particles.
Another similar set of test images was acquired by imaging
nanoscale dye particles on printing paper by the same
FIB SEM microscope.
The small FOVs have an overlap of 10% in horizontal and vertical
directions, and they form a grid of 20 x 20 raw image tiles.
Given these two data sets, materials scientists can
characterize spatial distribution of nanoparticles.